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Metric information mining with metric attention to boost software defect prediction performance.

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Title: Metric information mining with metric attention to boost software defect prediction performance.
Authors: Ding, Yongchang1, Han, Wei1, Li, Zhiqiang2, Chen, Haowen3, Chen, Linjun1, Peng, Rong1, rongpeng@whu.edu.cn, Jing, Xiao-Yuan1,4, jingxy_2000@126.com
Source: Science of Computer Programming; Mar2026, Vol. 248, pN.PAG-N.PAG, 1p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 189035012
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Metric information mining with metric attention to boost software defect prediction performance.
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1016/j.scico.2025.103381
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      – Code: eng
        Text: English
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      – TitleFull: Metric information mining with metric attention to boost software defect prediction performance.
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            – D: 01
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              Text: Mar2026
              Type: published
              Y: 2026
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