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Metric information mining with metric attention to boost software defect prediction performance.

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Bibliographic Details
Title: Metric information mining with metric attention to boost software defect prediction performance.
Authors: Ding, Yongchang1, Han, Wei1, Li, Zhiqiang2, Chen, Haowen3, Chen, Linjun1, Peng, Rong1, rongpeng@whu.edu.cn, Jing, Xiao-Yuan1,4, jingxy_2000@126.com
Source: Science of Computer Programming; Mar2026, Vol. 248, pN.PAG-N.PAG, 1p
Database: Applied Science & Technology Source
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