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Machine learning-based non-destructive method for identifying defect causes in OLED displays to enhance productivity.

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Bibliographic Details
Title: Machine learning-based non-destructive method for identifying defect causes in OLED displays to enhance productivity.
Authors: Han, Jun Hee1, jjunihan@lgdisplay.com, Jeong, Yoonseob1, Chun, Minkyu1, Yoon, Sang Won1, Choi, Jeong-Hyeon1, Choi, Young Jun1, Kim, Young Mi1, Jung, Sang Hoon1, Yang, Joon-Young1, Yoon, Sooyoung1
Source: Journal of Intelligent Manufacturing; Dec2025, Vol. 36 Issue 8, p5461-5473, 13p
Database: Applied Science & Technology Source
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Description
ISSN:09565515
DOI:10.1007/s10845-024-02530-z