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Machine learning-based non-destructive method for identifying defect causes in OLED displays to enhance productivity.

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Title: Machine learning-based non-destructive method for identifying defect causes in OLED displays to enhance productivity.
Authors: Han, Jun Hee1, jjunihan@lgdisplay.com, Jeong, Yoonseob1, Chun, Minkyu1, Yoon, Sang Won1, Choi, Jeong-Hyeon1, Choi, Young Jun1, Kim, Young Mi1, Jung, Sang Hoon1, Yang, Joon-Young1, Yoon, Sooyoung1
Source: Journal of Intelligent Manufacturing; Dec2025, Vol. 36 Issue 8, p5461-5473, 13p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Machine learning-based non-destructive method for identifying defect causes in OLED displays to enhance productivity.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Intelligent+Manufacturing%22">Journal of Intelligent Manufacturing</searchLink>; Dec2025, Vol. 36 Issue 8, p5461-5473, 13p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=189056619
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        Value: 10.1007/s10845-024-02530-z
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        Text: English
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              Text: Dec2025
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