Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf0.5Zr0.5O2 ferroelectric capacitors probed by hard x-ray photoelectron spectroscopy.
Saved in:
| Title: | Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf0.5Zr0.5O2 ferroelectric capacitors probed by hard x-ray photoelectron spectroscopy. |
|---|---|
| Authors: | Hamouda, W.1, Yamashita, Y.2, Ueda, S.2,3, Matzen, S.4, Renault, O.5, Mehmood, F.6, Mikolajick, T.6, Schroeder, U.6, Barrett, N.1, nick.barrett@cea.fr |
| Source: | Applied Physics Letters; 11/3/2025, Vol. 127 Issue 18, p1-7, 7p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036951 |
|---|---|
| DOI: | 10.1063/5.0288835 |
