Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf0.5Zr0.5O2 ferroelectric capacitors probed by hard x-ray photoelectron spectroscopy.
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| Title: | Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf0.5Zr0.5O2 ferroelectric capacitors probed by hard x-ray photoelectron spectroscopy. |
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| Authors: | Hamouda, W.1, Yamashita, Y.2, Ueda, S.2,3, Matzen, S.4, Renault, O.5, Mehmood, F.6, Mikolajick, T.6, Schroeder, U.6, Barrett, N.1, nick.barrett@cea.fr |
| Source: | Applied Physics Letters; 11/3/2025, Vol. 127 Issue 18, p1-7, 7p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 189179092 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf0.5Zr0.5O2 ferroelectric capacitors probed by hard x-ray photoelectron spectroscopy. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Hamouda%2C+W%2E%22">Hamouda, W.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Yamashita%2C+Y%2E%22">Yamashita, Y.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Ueda%2C+S%2E%22">Ueda, S.</searchLink><relatesTo>2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Matzen%2C+S%2E%22">Matzen, S.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Renault%2C+O%2E%22">Renault, O.</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AU" term="%22Mehmood%2C+F%2E%22">Mehmood, F.</searchLink><relatesTo>6</relatesTo><br /><searchLink fieldCode="AU" term="%22Mikolajick%2C+T%2E%22">Mikolajick, T.</searchLink><relatesTo>6</relatesTo><br /><searchLink fieldCode="AU" term="%22Schroeder%2C+U%2E%22">Schroeder, U.</searchLink><relatesTo>6</relatesTo><br /><searchLink fieldCode="AU" term="%22Barrett%2C+N%2E%22">Barrett, N.</searchLink><relatesTo>1</relatesTo>, <i>nick.barrett@cea.fr</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; 11/3/2025, Vol. 127 Issue 18, p1-7, 7p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=189179092 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1063/5.0288835 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 7 StartPage: 1 Titles: – TitleFull: Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf0.5Zr0.5O2 ferroelectric capacitors probed by hard x-ray photoelectron spectroscopy. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Hamouda, W. – PersonEntity: Name: NameFull: Yamashita, Y. – PersonEntity: Name: NameFull: Ueda, S. – PersonEntity: Name: NameFull: Matzen, S. – PersonEntity: Name: NameFull: Renault, O. – PersonEntity: Name: NameFull: Mehmood, F. – PersonEntity: Name: NameFull: Mikolajick, T. – PersonEntity: Name: NameFull: Schroeder, U. – PersonEntity: Name: NameFull: Barrett, N. IsPartOfRelationships: – BibEntity: Dates: – D: 03 M: 11 Text: 11/3/2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 00036951 Numbering: – Type: volume Value: 127 – Type: issue Value: 18 Titles: – TitleFull: Applied Physics Letters Type: main |
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