Advancing YOLOv8-Based Wafer Notch-Angle Detection Using Oriented Bounding Boxes, Hyperparameter Tuning, Architecture Refinement, and Transfer Learning.
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| Title: | Advancing YOLOv8-Based Wafer Notch-Angle Detection Using Oriented Bounding Boxes, Hyperparameter Tuning, Architecture Refinement, and Transfer Learning. |
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| Authors: | Jun, Eun Seok1, Sim, Hyo Jun1, Moon, Seung Jae1, smoon@hanyang.ac.kr |
| Source: | Applied Sciences (2076-3417); Nov2025, Vol. 15 Issue 21, p11507, 18p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 20763417 |
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| DOI: | 10.3390/app152111507 |
