Stitching Interferometry for X-Ray Mirror Metrology at the Hefei Advanced Light Facility (HALF).

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Bibliographic Details
Title: Stitching Interferometry for X-Ray Mirror Metrology at the Hefei Advanced Light Facility (HALF).
Authors: Wang, Yanghui1, Zhao, Yifan2, Wang, Huiyun2, Hu, Yiyang1, He, Liang1, Zhao, Shuai1, Du, Xuewei1
Source: Photonics; Nov2025, Vol. 12 Issue 11, p1106, 17p
Database: Applied Science & Technology Source
Description
ISSN:23046732
DOI:10.3390/photonics12111106