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LTP-corrected stitching interferometer achieving sub-nanometer accuracy for x-ray mirror metrology.

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Title: LTP-corrected stitching interferometer achieving sub-nanometer accuracy for x-ray mirror metrology.
Authors: Wang, Yanghui1, Zhao, Shuai1, shuai.zhao@ustc.edu.cn, Wang, Huiyun2, Hu, Yiyang1, He, Liang1, Fu, Shuo1, Liu, Zhengkun1, Du, Xuewei1, shuai.zhao@ustc.edu.cn, Wang, Qiuping1
Source: Review of Scientific Instruments; Dec2025, Vol. 96 Issue 12, p1-8, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 190607201
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Label: Title
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  Data: LTP-corrected stitching interferometer achieving sub-nanometer accuracy for x-ray mirror metrology.
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  Data: <searchLink fieldCode="AU" term="%22Wang%2C+Yanghui%22">Wang, Yanghui</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhao%2C+Shuai%22">Zhao, Shuai</searchLink><relatesTo>1</relatesTo>, <i>shuai.zhao@ustc.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Wang%2C+Huiyun%22">Wang, Huiyun</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Hu%2C+Yiyang%22">Hu, Yiyang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22He%2C+Liang%22">He, Liang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Fu%2C+Shuo%22">Fu, Shuo</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+Zhengkun%22">Liu, Zhengkun</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Du%2C+Xuewei%22">Du, Xuewei</searchLink><relatesTo>1</relatesTo>, <i>shuai.zhao@ustc.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Wang%2C+Qiuping%22">Wang, Qiuping</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Review+of+Scientific+Instruments%22">Review of Scientific Instruments</searchLink>; Dec2025, Vol. 96 Issue 12, p1-8, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=190607201
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      – Type: doi
        Value: 10.1063/5.0293552
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      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 1
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      – TitleFull: LTP-corrected stitching interferometer achieving sub-nanometer accuracy for x-ray mirror metrology.
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            NameFull: Wang, Yanghui
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            NameFull: Zhao, Shuai
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            – D: 01
              M: 12
              Text: Dec2025
              Type: published
              Y: 2025
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              Value: 12
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