High‐Throughput Ellipsometric Contrast Microscopy of Lateral 2D Heterostructures for Optoelectronics.
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| Title: | High‐Throughput Ellipsometric Contrast Microscopy of Lateral 2D Heterostructures for Optoelectronics. |
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| Authors: | Potočnik, Teja1, Burton, Oliver1, Chakraborty, Suman K.2, Ray, Purbasha2, Mouthaan, Ralf3, Christopher, Peter J.4, Tirandaz, Zeinab1, Lin, Xiaofan1, Joyce, Hannah J.1, Hofmann, Stephan1, Sahoo, Prasana K.2, Alexander‐Webber, Jack A.1, jaa59@cam.ac.uk |
| Source: | Small Methods; 1/22/2026, Vol. 10 Issue 2, p1-8, 8p |
| Database: | Applied Science & Technology Source |
| ISSN: | 23669608 |
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| DOI: | 10.1002/smtd.202500437 |
