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High‐Throughput Ellipsometric Contrast Microscopy of Lateral 2D Heterostructures for Optoelectronics.

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Title: High‐Throughput Ellipsometric Contrast Microscopy of Lateral 2D Heterostructures for Optoelectronics.
Authors: Potočnik, Teja1, Burton, Oliver1, Chakraborty, Suman K.2, Ray, Purbasha2, Mouthaan, Ralf3, Christopher, Peter J.4, Tirandaz, Zeinab1, Lin, Xiaofan1, Joyce, Hannah J.1, Hofmann, Stephan1, Sahoo, Prasana K.2, Alexander‐Webber, Jack A.1, jaa59@cam.ac.uk
Source: Small Methods; 1/22/2026, Vol. 10 Issue 2, p1-8, 8p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 191073517
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PubType: Academic Journal
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        Value: 10.1002/smtd.202500437
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              Text: 1/22/2026
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