In Situ Single‐Event Upset Tolerant Flip‐Flip Designs for Nanoscale Technology.
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| Title: | In Situ Single‐Event Upset Tolerant Flip‐Flip Designs for Nanoscale Technology. |
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| Authors: | Li, Hongchen1, Zhao, Xiaofeng1, zhaoxiaofeng@hlju.edu.cn, Li, Jie2, Li, Mingxue2 |
| Source: | International Journal of Circuit Theory & Applications; Mar2026, Vol. 54 Issue 3, p1373-1384, 12p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00989886 |
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| DOI: | 10.1002/cta.70014 |
