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In Situ Single‐Event Upset Tolerant Flip‐Flip Designs for Nanoscale Technology.

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Title: In Situ Single‐Event Upset Tolerant Flip‐Flip Designs for Nanoscale Technology.
Authors: Li, Hongchen1, Zhao, Xiaofeng1, zhaoxiaofeng@hlju.edu.cn, Li, Jie2, Li, Mingxue2
Source: International Journal of Circuit Theory & Applications; Mar2026, Vol. 54 Issue 3, p1373-1384, 12p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 192090910
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: In Situ Single‐Event Upset Tolerant Flip‐Flip Designs for Nanoscale Technology.
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  Data: <searchLink fieldCode="AU" term="%22Li%2C+Hongchen%22">Li, Hongchen</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhao%2C+Xiaofeng%22">Zhao, Xiaofeng</searchLink><relatesTo>1</relatesTo>, <i>zhaoxiaofeng@hlju.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Li%2C+Jie%22">Li, Jie</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Mingxue%22">Li, Mingxue</searchLink><relatesTo>2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Circuit+Theory+%26+Applications%22">International Journal of Circuit Theory & Applications</searchLink>; Mar2026, Vol. 54 Issue 3, p1373-1384, 12p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=192090910
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1002/cta.70014
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 12
        StartPage: 1373
    Titles:
      – TitleFull: In Situ Single‐Event Upset Tolerant Flip‐Flip Designs for Nanoscale Technology.
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          Name:
            NameFull: Li, Hongchen
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            NameFull: Zhao, Xiaofeng
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          Name:
            NameFull: Li, Jie
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            NameFull: Li, Mingxue
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            – D: 01
              M: 03
              Text: Mar2026
              Type: published
              Y: 2026
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              Value: 54
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              Value: 3
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            – TitleFull: International Journal of Circuit Theory & Applications
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