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In Situ Single‐Event Upset Tolerant Flip‐Flip Designs for Nanoscale Technology.

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Bibliographic Details
Title: In Situ Single‐Event Upset Tolerant Flip‐Flip Designs for Nanoscale Technology.
Authors: Li, Hongchen1, Zhao, Xiaofeng1, zhaoxiaofeng@hlju.edu.cn, Li, Jie2, Li, Mingxue2
Source: International Journal of Circuit Theory & Applications; Mar2026, Vol. 54 Issue 3, p1373-1384, 12p
Database: Applied Science & Technology Source
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