A deep learning based visual inspection of small-batch electronic assembly using few-shot-driven synthetic data.

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Bibliographic Details
Title: A deep learning based visual inspection of small-batch electronic assembly using few-shot-driven synthetic data.
Authors: Jiang, Mingxing1, 220220329@seu.edu.cn, Liu, Tingyu1,2, tingyu@seu.edu.cn, Li, Songyang1, 220220360@seu.edu.cn, Lai, Xiao1, 220230381@seu.edu.cn, Jiao, Lei1, jiaolei@seu.edu.cn, Ni, Zhonghua1,2, nzh2003@seu.edu.cn
Source: Journal of Intelligent Manufacturing; Apr2026, Vol. 37 Issue 4, p1571-1590, 20p
Database: Applied Science & Technology Source
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Description
ISSN:09565515
DOI:10.1007/s10845-025-02610-8