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A deep learning based visual inspection of small-batch electronic assembly using few-shot-driven synthetic data.

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Title: A deep learning based visual inspection of small-batch electronic assembly using few-shot-driven synthetic data.
Authors: Jiang, Mingxing1, 220220329@seu.edu.cn, Liu, Tingyu1,2, tingyu@seu.edu.cn, Li, Songyang1, 220220360@seu.edu.cn, Lai, Xiao1, 220230381@seu.edu.cn, Jiao, Lei1, jiaolei@seu.edu.cn, Ni, Zhonghua1,2, nzh2003@seu.edu.cn
Source: Journal of Intelligent Manufacturing; Apr2026, Vol. 37 Issue 4, p1571-1590, 20p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 192844963
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PubType: Academic Journal
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  Data: A deep learning based visual inspection of small-batch electronic assembly using few-shot-driven synthetic data.
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=192844963
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1007/s10845-025-02610-8
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      – Code: eng
        Text: English
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        PageCount: 20
        StartPage: 1571
    Titles:
      – TitleFull: A deep learning based visual inspection of small-batch electronic assembly using few-shot-driven synthetic data.
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            NameFull: Jiang, Mingxing
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            NameFull: Liu, Tingyu
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            NameFull: Li, Songyang
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            NameFull: Lai, Xiao
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            – D: 01
              M: 04
              Text: Apr2026
              Type: published
              Y: 2026
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