A deep learning based visual inspection of small-batch electronic assembly using few-shot-driven synthetic data.
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| Title: | A deep learning based visual inspection of small-batch electronic assembly using few-shot-driven synthetic data. |
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| Authors: | Jiang, Mingxing1, 220220329@seu.edu.cn, Liu, Tingyu1,2, tingyu@seu.edu.cn, Li, Songyang1, 220220360@seu.edu.cn, Lai, Xiao1, 220230381@seu.edu.cn, Jiao, Lei1, jiaolei@seu.edu.cn, Ni, Zhonghua1,2, nzh2003@seu.edu.cn |
| Source: | Journal of Intelligent Manufacturing; Apr2026, Vol. 37 Issue 4, p1571-1590, 20p |
| Database: | Applied Science & Technology Source |
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