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Comparison of Thin Film Thickness Determination Methods Based on X‐Ray Reflectivity.

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Bibliographic Details
Title: Comparison of Thin Film Thickness Determination Methods Based on X‐Ray Reflectivity.
Authors: Lishchenko, Natalia1, lishchen@tcd.ie, Morris, Michael2, Larshin, Vasily3, Bardhan, Munmun, mbardhan@wiley.com
Source: Journal of Nanotechnology; 4/24/2026, Vol. 2026, p1-17, 17p
Database: Applied Science & Technology Source
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ISSN:16879503
DOI:10.1155/jnt/8821511