APA (7th ed.) Citation

Lishchenko, N., Morris, M., Larshin, V., & Bardhan, M. (2026). Comparison of Thin Film Thickness Determination Methods Based on X‐Ray Reflectivity. Journal of Nanotechnology, 2026, 1. https://doi.org/10.1155/jnt/8821511

Chicago Style (17th ed.) Citation

Lishchenko, Natalia, Michael Morris, Vasily Larshin, and Munmun Bardhan. "Comparison of Thin Film Thickness Determination Methods Based on X‐Ray Reflectivity." Journal of Nanotechnology 2026 (2026): 1. https://doi.org/10.1155/jnt/8821511.

MLA (9th ed.) Citation

Lishchenko, Natalia, et al. "Comparison of Thin Film Thickness Determination Methods Based on X‐Ray Reflectivity." Journal of Nanotechnology, vol. 2026, 2026, p. 1, https://doi.org/10.1155/jnt/8821511.