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Comparison of Thin Film Thickness Determination Methods Based on X‐Ray Reflectivity.

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Title: Comparison of Thin Film Thickness Determination Methods Based on X‐Ray Reflectivity.
Authors: Lishchenko, Natalia1, lishchen@tcd.ie, Morris, Michael2, Larshin, Vasily3, Bardhan, Munmun, mbardhan@wiley.com
Source: Journal of Nanotechnology; 4/24/2026, Vol. 2026, p1-17, 17p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 193256719
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PubType: Academic Journal
PubTypeId: academicJournal
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Comparison of Thin Film Thickness Determination Methods Based on X‐Ray Reflectivity.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Lishchenko%2C+Natalia%22">Lishchenko, Natalia</searchLink><relatesTo>1</relatesTo>, <i>lishchen@tcd.ie</i><br /><searchLink fieldCode="AU" term="%22Morris%2C+Michael%22">Morris, Michael</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Larshin%2C+Vasily%22">Larshin, Vasily</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Bardhan%2C+Munmun%22">Bardhan, Munmun</searchLink>, <i>mbardhan@wiley.com</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Nanotechnology%22">Journal of Nanotechnology</searchLink>; 4/24/2026, Vol. 2026, p1-17, 17p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193256719
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1155/jnt/8821511
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 17
        StartPage: 1
    Titles:
      – TitleFull: Comparison of Thin Film Thickness Determination Methods Based on X‐Ray Reflectivity.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Lishchenko, Natalia
      – PersonEntity:
          Name:
            NameFull: Morris, Michael
      – PersonEntity:
          Name:
            NameFull: Larshin, Vasily
      – PersonEntity:
          Name:
            NameFull: Bardhan, Munmun
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 24
              M: 04
              Text: 4/24/2026
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 16879503
          Numbering:
            – Type: volume
              Value: 2026
          Titles:
            – TitleFull: Journal of Nanotechnology
              Type: main
ResultId 1