Temperature-Dependent Sn Incorporation and Defect Formation in Pseudomorphic SiSn Layers on Si (001) via Molecular Beam Epitaxy.
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| Title: | Temperature-Dependent Sn Incorporation and Defect Formation in Pseudomorphic SiSn Layers on Si (001) via Molecular Beam Epitaxy. |
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| Authors: | Zhang, Diandian1, Eldose, Nirosh M.2, Baral, Dinesh1,2,3, Stanchu, Hryhorii1,2, Benamara, Mourad1,2, Du, Wei1,2,3, Salamo, Gregory J.2,3, Yu, Shui-Qing1,2, syu@uark.edu |
| Source: | Crystals (2073-4352); Apr2026, Vol. 16 Issue 4, p262, 10p |
| Database: | Applied Science & Technology Source |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 193440035 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Temperature-Dependent Sn Incorporation and Defect Formation in Pseudomorphic SiSn Layers on Si (001) via Molecular Beam Epitaxy. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Zhang%2C+Diandian%22">Zhang, Diandian</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Eldose%2C+Nirosh+M%2E%22">Eldose, Nirosh M.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Baral%2C+Dinesh%22">Baral, Dinesh</searchLink><relatesTo>1,2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Stanchu%2C+Hryhorii%22">Stanchu, Hryhorii</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Benamara%2C+Mourad%22">Benamara, Mourad</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Du%2C+Wei%22">Du, Wei</searchLink><relatesTo>1,2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Salamo%2C+Gregory+J%2E%22">Salamo, Gregory J.</searchLink><relatesTo>2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Yu%2C+Shui-Qing%22">Yu, Shui-Qing</searchLink><relatesTo>1,2</relatesTo>, <i>syu@uark.edu</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Crystals+%282073-4352%29%22">Crystals (2073-4352)</searchLink>; Apr2026, Vol. 16 Issue 4, p262, 10p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193440035 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.3390/cryst16040262 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 10 StartPage: 262 Titles: – TitleFull: Temperature-Dependent Sn Incorporation and Defect Formation in Pseudomorphic SiSn Layers on Si (001) via Molecular Beam Epitaxy. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Zhang, Diandian – PersonEntity: Name: NameFull: Eldose, Nirosh M. – PersonEntity: Name: NameFull: Baral, Dinesh – PersonEntity: Name: NameFull: Stanchu, Hryhorii – PersonEntity: Name: NameFull: Benamara, Mourad – PersonEntity: Name: NameFull: Du, Wei – PersonEntity: Name: NameFull: Salamo, Gregory J. – PersonEntity: Name: NameFull: Yu, Shui-Qing IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: Apr2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 20734352 Numbering: – Type: volume Value: 16 – Type: issue Value: 4 Titles: – TitleFull: Crystals (2073-4352) Type: main |
| ResultId | 1 |