Temperature-Dependent Sn Incorporation and Defect Formation in Pseudomorphic SiSn Layers on Si (001) via Molecular Beam Epitaxy.

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Title: Temperature-Dependent Sn Incorporation and Defect Formation in Pseudomorphic SiSn Layers on Si (001) via Molecular Beam Epitaxy.
Authors: Zhang, Diandian1, Eldose, Nirosh M.2, Baral, Dinesh1,2,3, Stanchu, Hryhorii1,2, Benamara, Mourad1,2, Du, Wei1,2,3, Salamo, Gregory J.2,3, Yu, Shui-Qing1,2, syu@uark.edu
Source: Crystals (2073-4352); Apr2026, Vol. 16 Issue 4, p262, 10p
Database: Applied Science & Technology Source
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An: 193440035
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  Data: Temperature-Dependent Sn Incorporation and Defect Formation in Pseudomorphic SiSn Layers on Si (001) via Molecular Beam Epitaxy.
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  Data: <searchLink fieldCode="JN" term="%22Crystals+%282073-4352%29%22">Crystals (2073-4352)</searchLink>; Apr2026, Vol. 16 Issue 4, p262, 10p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193440035
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        Value: 10.3390/cryst16040262
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      – Code: eng
        Text: English
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        PageCount: 10
        StartPage: 262
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      – TitleFull: Temperature-Dependent Sn Incorporation and Defect Formation in Pseudomorphic SiSn Layers on Si (001) via Molecular Beam Epitaxy.
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              Text: Apr2026
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              Y: 2026
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