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X-Ray Characterization of Semiconductor Materials and Advanced Packaging: A Perspective on Multidimensional Structural Analysis.

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Bibliographic Details
Title:	X-Ray Characterization of Semiconductor Materials and Advanced Packaging: A Perspective on Multidimensional Structural Analysis.
Authors:	Jiang, Yumeng¹, Zhang, Zhenwei^1,2, An, Zhongyi^1,2,3, Pan, Xinyu^4,5, Shi, Xinmin^1,5, Wang, Ruonan^1,6, Li, Jiajian¹, Chen, Chengzhi², Cao, Zhiqiang^1,3,6, Xu, Yong^1,2,4, Wei, Jiaqi^2,5, Zhang, Xueying^1,2,3,6, Peng, Yi^1,2
Source:	Crystals (2073-4352); Apr2026, Vol. 16 Issue 4, p265, 33p
Database:	Applied Science & Technology Source
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ISSN:	20734352
DOI:	10.3390/cryst16040265