APA (7th ed.) Citation

Jiang, Y., Zhang, Z., An, Z., Pan, X., Shi, X., Wang, R., . . . Peng, Y. (2026). X-Ray Characterization of Semiconductor Materials and Advanced Packaging: A Perspective on Multidimensional Structural Analysis. Crystals (2073-4352), 16(4), 265. https://doi.org/10.3390/cryst16040265

Chicago Style (17th ed.) Citation

Jiang, Yumeng, et al. "X-Ray Characterization of Semiconductor Materials and Advanced Packaging: A Perspective on Multidimensional Structural Analysis." Crystals (2073-4352) 16, no. 4 (2026): 265. https://doi.org/10.3390/cryst16040265.

MLA (9th ed.) Citation

Jiang, Yumeng, et al. "X-Ray Characterization of Semiconductor Materials and Advanced Packaging: A Perspective on Multidimensional Structural Analysis." Crystals (2073-4352), vol. 16, no. 4, 2026, p. 265, https://doi.org/10.3390/cryst16040265.