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Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs.

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Bibliographic Details
Title: Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs.
Authors: Ma, Wenxuan1, ytmawenxuan@163.com, Peng, Yue1, ypeng@xidian.edu.cn, Wu, Qiuxia1, 1641466982@qq.com, Zhang, Shuo1, 23111213714@stu.xidian.edu.cn, Sun, Litao1, 1077376116@qq.com, Xiao, Wenwu2, kybkxww@163.com, Zhang, Chunfu1, cfzhang@xidian.edu.cn, Ma, Xiaohua1, xhma@xidian.edu.cn, Hao, Yue1, yhao@xidian.edu.cn
Source: Discover Nano; 5/6/2026, Vol. 21 Issue 1, p1-12, 12p
Database: Applied Science & Technology Source
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ISSN:27319229
DOI:10.1186/s11671-026-04582-x