Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs.

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Title: Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs.
Authors: Ma, Wenxuan1, ytmawenxuan@163.com, Peng, Yue1, ypeng@xidian.edu.cn, Wu, Qiuxia1, 1641466982@qq.com, Zhang, Shuo1, 23111213714@stu.xidian.edu.cn, Sun, Litao1, 1077376116@qq.com, Xiao, Wenwu2, kybkxww@163.com, Zhang, Chunfu1, cfzhang@xidian.edu.cn, Ma, Xiaohua1, xhma@xidian.edu.cn, Hao, Yue1, yhao@xidian.edu.cn
Source: Discover Nano; 5/6/2026, Vol. 21 Issue 1, p1-12, 12p
Database: Applied Science & Technology Source
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An: 193494504
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  Data: Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs.
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  Data: <searchLink fieldCode="AU" term="%22Ma%2C+Wenxuan%22">Ma, Wenxuan</searchLink><relatesTo>1</relatesTo>, <i>ytmawenxuan@163.com</i><br /><searchLink fieldCode="AU" term="%22Peng%2C+Yue%22">Peng, Yue</searchLink><relatesTo>1</relatesTo>, <i>ypeng@xidian.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Wu%2C+Qiuxia%22">Wu, Qiuxia</searchLink><relatesTo>1</relatesTo>, <i>1641466982@qq.com</i><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Shuo%22">Zhang, Shuo</searchLink><relatesTo>1</relatesTo>, <i>23111213714@stu.xidian.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Sun%2C+Litao%22">Sun, Litao</searchLink><relatesTo>1</relatesTo>, <i>1077376116@qq.com</i><br /><searchLink fieldCode="AU" term="%22Xiao%2C+Wenwu%22">Xiao, Wenwu</searchLink><relatesTo>2</relatesTo>, <i>kybkxww@163.com</i><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Chunfu%22">Zhang, Chunfu</searchLink><relatesTo>1</relatesTo>, <i>cfzhang@xidian.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Ma%2C+Xiaohua%22">Ma, Xiaohua</searchLink><relatesTo>1</relatesTo>, <i>xhma@xidian.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Hao%2C+Yue%22">Hao, Yue</searchLink><relatesTo>1</relatesTo>, <i>yhao@xidian.edu.cn</i>
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  Data: <searchLink fieldCode="JN" term="%22Discover+Nano%22">Discover Nano</searchLink>; 5/6/2026, Vol. 21 Issue 1, p1-12, 12p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193494504
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        Value: 10.1186/s11671-026-04582-x
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      – Code: eng
        Text: English
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              Text: 5/6/2026
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              Y: 2026
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