Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs.
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| Title: | Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs. |
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| Authors: | Ma, Wenxuan1, ytmawenxuan@163.com, Peng, Yue1, ypeng@xidian.edu.cn, Wu, Qiuxia1, 1641466982@qq.com, Zhang, Shuo1, 23111213714@stu.xidian.edu.cn, Sun, Litao1, 1077376116@qq.com, Xiao, Wenwu2, kybkxww@163.com, Zhang, Chunfu1, cfzhang@xidian.edu.cn, Ma, Xiaohua1, xhma@xidian.edu.cn, Hao, Yue1, yhao@xidian.edu.cn |
| Source: | Discover Nano; 5/6/2026, Vol. 21 Issue 1, p1-12, 12p |
| Database: | Applied Science & Technology Source |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 193494504 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Ma%2C+Wenxuan%22">Ma, Wenxuan</searchLink><relatesTo>1</relatesTo>, <i>ytmawenxuan@163.com</i><br /><searchLink fieldCode="AU" term="%22Peng%2C+Yue%22">Peng, Yue</searchLink><relatesTo>1</relatesTo>, <i>ypeng@xidian.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Wu%2C+Qiuxia%22">Wu, Qiuxia</searchLink><relatesTo>1</relatesTo>, <i>1641466982@qq.com</i><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Shuo%22">Zhang, Shuo</searchLink><relatesTo>1</relatesTo>, <i>23111213714@stu.xidian.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Sun%2C+Litao%22">Sun, Litao</searchLink><relatesTo>1</relatesTo>, <i>1077376116@qq.com</i><br /><searchLink fieldCode="AU" term="%22Xiao%2C+Wenwu%22">Xiao, Wenwu</searchLink><relatesTo>2</relatesTo>, <i>kybkxww@163.com</i><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Chunfu%22">Zhang, Chunfu</searchLink><relatesTo>1</relatesTo>, <i>cfzhang@xidian.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Ma%2C+Xiaohua%22">Ma, Xiaohua</searchLink><relatesTo>1</relatesTo>, <i>xhma@xidian.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Hao%2C+Yue%22">Hao, Yue</searchLink><relatesTo>1</relatesTo>, <i>yhao@xidian.edu.cn</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Discover+Nano%22">Discover Nano</searchLink>; 5/6/2026, Vol. 21 Issue 1, p1-12, 12p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193494504 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1186/s11671-026-04582-x Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 12 StartPage: 1 Titles: – TitleFull: Impact of ferroelectric polarization dynamics on thermal reliability in Ferro-FinFETs. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Ma, Wenxuan – PersonEntity: Name: NameFull: Peng, Yue – PersonEntity: Name: NameFull: Wu, Qiuxia – PersonEntity: Name: NameFull: Zhang, Shuo – PersonEntity: Name: NameFull: Sun, Litao – PersonEntity: Name: NameFull: Xiao, Wenwu – PersonEntity: Name: NameFull: Zhang, Chunfu – PersonEntity: Name: NameFull: Ma, Xiaohua – PersonEntity: Name: NameFull: Hao, Yue IsPartOfRelationships: – BibEntity: Dates: – D: 06 M: 05 Text: 5/6/2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 27319229 Numbering: – Type: volume Value: 21 – Type: issue Value: 1 Titles: – TitleFull: Discover Nano Type: main |
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