Field-Effect Transistor Based on Reduced Graphene Oxide Film with ZnO and Porous Silicon Absorbing Layers for Ionizing Radiation Detection.
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| Title: | Field-Effect Transistor Based on Reduced Graphene Oxide Film with ZnO and Porous Silicon Absorbing Layers for Ionizing Radiation Detection. |
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| Authors: | Olenych, I. B.1, igor.olenych@lnu.edu.ua, Horbenko, Yu. Yu.2, Pavlyk, M. R.1, Sokolovskii, B. S.1, Dzendzelyuk, O. S.1 |
| Source: | Journal of Nano- & Electronic Physics; 2026, Vol. 18 Issue 2, p02026-1-02026-5, 5p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 193846233 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193846233 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.21272/jnep.18(2).02026 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 5 StartPage: 02026-1 Titles: – TitleFull: Field-Effect Transistor Based on Reduced Graphene Oxide Film with ZnO and Porous Silicon Absorbing Layers for Ionizing Radiation Detection. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Olenych, I. B. – PersonEntity: Name: NameFull: Horbenko, Yu. Yu. – PersonEntity: Name: NameFull: Pavlyk, M. R. – PersonEntity: Name: NameFull: Sokolovskii, B. S. – PersonEntity: Name: NameFull: Dzendzelyuk, O. S. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 03 Text: 2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 20776772 Numbering: – Type: volume Value: 18 – Type: issue Value: 2 Titles: – TitleFull: Journal of Nano- & Electronic Physics Type: main |
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