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Wafer Defect Classification Method Based on Improved EfficientNet Model.

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Title: Wafer Defect Classification Method Based on Improved EfficientNet Model.
Authors: Zhu, Liling1,2, Wu, Zhipeng1,2, wuzhipeng@ime.ac.cn
Source: Applied Sciences (2076-3417); May2026, Vol. 16 Issue 10, p4747, 22p
Database: Applied Science & Technology Source
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ISSN:20763417
DOI:10.3390/app16104747