An Analysis of the Effect of Fault Location on the Transient Stability of a PV-Integrated IEEE 30 Bus System with FACTS Devices.

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Bibliographic Details
Title:	An Analysis of the Effect of Fault Location on the Transient Stability of a PV-Integrated IEEE 30 Bus System with FACTS Devices.
Authors:	Chekembou, Mohammed Soufiane¹, m.chekembou@lagh-univ.dz, Omrane, Mohammed¹, m.omrane@lagh-univ.dz, Mokrani, Lakhdar¹, l.mokrani@lagh-univ.dz, Medjghou, Ali², medjghou.ali@gmail.com, Naimi, Djemai³, Miloudi, Khaled⁴, d.naimi@univ-biskra.dz
Source:	Engineering, Technology & Applied Science Research; Apr2026, Vol. 16 Issue 2, p33351-33358, 8p
Database:	Applied Science & Technology Source

Description
ISSN:	22414487
DOI:	10.48084/etasr.17081