View in EDS PDF Full Text

An Analysis of the Effect of Fault Location on the Transient Stability of a PV-Integrated IEEE 30 Bus System with FACTS Devices.

Saved in:
Bibliographic Details
Title: An Analysis of the Effect of Fault Location on the Transient Stability of a PV-Integrated IEEE 30 Bus System with FACTS Devices.
Authors: Chekembou, Mohammed Soufiane1, m.chekembou@lagh-univ.dz, Omrane, Mohammed1, m.omrane@lagh-univ.dz, Mokrani, Lakhdar1, l.mokrani@lagh-univ.dz, Medjghou, Ali2, medjghou.ali@gmail.com, Naimi, Djemai3, Miloudi, Khaled4, d.naimi@univ-biskra.dz
Source: Engineering, Technology & Applied Science Research; Apr2026, Vol. 16 Issue 2, p33351-33358, 8p
Database: Applied Science & Technology Source
FullText Links:
  – Type: pdflink
Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 194189324
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: An Analysis of the Effect of Fault Location on the Transient Stability of a PV-Integrated IEEE 30 Bus System with FACTS Devices.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Chekembou%2C+Mohammed+Soufiane%22">Chekembou, Mohammed Soufiane</searchLink><relatesTo>1</relatesTo>, <i>m.chekembou@lagh-univ.dz</i><br /><searchLink fieldCode="AU" term="%22Omrane%2C+Mohammed%22">Omrane, Mohammed</searchLink><relatesTo>1</relatesTo>, <i>m.omrane@lagh-univ.dz</i><br /><searchLink fieldCode="AU" term="%22Mokrani%2C+Lakhdar%22">Mokrani, Lakhdar</searchLink><relatesTo>1</relatesTo>, <i>l.mokrani@lagh-univ.dz</i><br /><searchLink fieldCode="AU" term="%22Medjghou%2C+Ali%22">Medjghou, Ali</searchLink><relatesTo>2</relatesTo>, <i>medjghou.ali@gmail.com</i><br /><searchLink fieldCode="AU" term="%22Naimi%2C+Djemai%22">Naimi, Djemai</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Miloudi%2C+Khaled%22">Miloudi, Khaled</searchLink><relatesTo>4</relatesTo>, <i>d.naimi@univ-biskra.dz</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Engineering%2C+Technology+%26+Applied+Science+Research%22">Engineering, Technology & Applied Science Research</searchLink>; Apr2026, Vol. 16 Issue 2, p33351-33358, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=194189324
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.48084/etasr.17081
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 8
        StartPage: 33351
    Titles:
      – TitleFull: An Analysis of the Effect of Fault Location on the Transient Stability of a PV-Integrated IEEE 30 Bus System with FACTS Devices.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Chekembou, Mohammed Soufiane
      – PersonEntity:
          Name:
            NameFull: Omrane, Mohammed
      – PersonEntity:
          Name:
            NameFull: Mokrani, Lakhdar
      – PersonEntity:
          Name:
            NameFull: Medjghou, Ali
      – PersonEntity:
          Name:
            NameFull: Naimi, Djemai
      – PersonEntity:
          Name:
            NameFull: Miloudi, Khaled
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 04
              Text: Apr2026
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 22414487
          Numbering:
            – Type: volume
              Value: 16
            – Type: issue
              Value: 2
          Titles:
            – TitleFull: Engineering, Technology & Applied Science Research
              Type: main
ResultId 1