Computation and sensitivity analysis of the deformation gradient tensor reconstruction in dark‐field X‐ray microscopy.
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| Title: | Computation and sensitivity analysis of the deformation gradient tensor reconstruction in dark‐field X‐ray microscopy. |
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| Authors: | Kanesalingam, Brinthan1,2,3, Chalise, Darshan1,2,4, Detlefs, Carsten5, Dresselhaus-Marais, Leora1,2,3,4, leoradm@stanford.edu |
| Source: | Journal of Applied Crystallography; Jun2026, Vol. 59 Issue 3, p716-736, 21p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218898 |
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| DOI: | 10.1107/S1600576726001226 |
