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Computation and sensitivity analysis of the deformation gradient tensor reconstruction in dark‐field X‐ray microscopy.

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Title: Computation and sensitivity analysis of the deformation gradient tensor reconstruction in dark‐field X‐ray microscopy.
Authors: Kanesalingam, Brinthan1,2,3, Chalise, Darshan1,2,4, Detlefs, Carsten5, Dresselhaus-Marais, Leora1,2,3,4, leoradm@stanford.edu
Source: Journal of Applied Crystallography; Jun2026, Vol. 59 Issue 3, p716-736, 21p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 194204557
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Computation and sensitivity analysis of the deformation gradient tensor reconstruction in dark‐field X‐ray microscopy.
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  Data: <searchLink fieldCode="AU" term="%22Kanesalingam%2C+Brinthan%22">Kanesalingam, Brinthan</searchLink><relatesTo>1,2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Chalise%2C+Darshan%22">Chalise, Darshan</searchLink><relatesTo>1,2,4</relatesTo><br /><searchLink fieldCode="AU" term="%22Detlefs%2C+Carsten%22">Detlefs, Carsten</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AU" term="%22Dresselhaus-Marais%2C+Leora%22">Dresselhaus-Marais, Leora</searchLink><relatesTo>1,2,3,4</relatesTo>, <i>leoradm@stanford.edu</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Crystallography%22">Journal of Applied Crystallography</searchLink>; Jun2026, Vol. 59 Issue 3, p716-736, 21p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=194204557
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1107/S1600576726001226
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 21
        StartPage: 716
    Titles:
      – TitleFull: Computation and sensitivity analysis of the deformation gradient tensor reconstruction in dark‐field X‐ray microscopy.
        Type: main
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            NameFull: Kanesalingam, Brinthan
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            NameFull: Chalise, Darshan
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            NameFull: Detlefs, Carsten
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            NameFull: Dresselhaus-Marais, Leora
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          Dates:
            – D: 01
              M: 06
              Text: Jun2026
              Type: published
              Y: 2026
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              Value: 00218898
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              Value: 59
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              Value: 3
          Titles:
            – TitleFull: Journal of Applied Crystallography
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