Gaussian Process Surrogate Model with Uncertainty Quantification for PWR Pin-Cell Criticality Prediction.

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Bibliographic Details
Title: Gaussian Process Surrogate Model with Uncertainty Quantification for PWR Pin-Cell Criticality Prediction.
Authors: Molczan, Adam1, Malecha, Ziemowit2, ziemowit.malecha@pwr.edu.pl, Zacharczuk, Wojciech3
Source: Applied Sciences (2076-3417); Jun2026, Vol. 16 Issue 11, p5174, 20p
Database: Applied Science & Technology Source
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ISSN:20763417
DOI:10.3390/app16115174