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Gaussian Process Surrogate Model with Uncertainty Quantification for PWR Pin-Cell Criticality Prediction.

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Title: Gaussian Process Surrogate Model with Uncertainty Quantification for PWR Pin-Cell Criticality Prediction.
Authors: Molczan, Adam1, Malecha, Ziemowit2, ziemowit.malecha@pwr.edu.pl, Zacharczuk, Wojciech3
Source: Applied Sciences (2076-3417); Jun2026, Vol. 16 Issue 11, p5174, 20p
Database: Applied Science & Technology Source
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      – Type: doi
        Value: 10.3390/app16115174
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      – Code: eng
        Text: English
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        PageCount: 20
        StartPage: 5174
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      – TitleFull: Gaussian Process Surrogate Model with Uncertainty Quantification for PWR Pin-Cell Criticality Prediction.
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            NameFull: Molczan, Adam
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            NameFull: Malecha, Ziemowit
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            – D: 01
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              Text: Jun2026
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              Y: 2026
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