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Power-Law Degradation and Lifetime Interpretation in Microelectronics Reliability.

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Bibliographic Details
Title:	Power-Law Degradation and Lifetime Interpretation in Microelectronics Reliability.
Authors:	Bernstein, Joseph B.¹
Source:	Applied Sciences (2076-3417); Jun2026, Vol. 16 Issue 11, p5387, 21p
Database:	Applied Science & Technology Source
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Description
ISSN:	20763417
DOI:	10.3390/app16115387