Chandrasekaran, S., Hua, C., Gao, S., Xue, G., Wen, J., Jabir, A., . . . Khateb, F. (2026). Memristor‐Based Logic Circuits: Gate Designs and Cycle‐To‐Cycle Reliability. IET Circuits, Devices & Systems (Wiley-Blackwell), 2026, 1. https://doi.org/10.1049/cds2/9915488
Chicago Style (17th ed.) CitationChandrasekaran, Sridhar, et al. "Memristor‐Based Logic Circuits: Gate Designs and Cycle‐To‐Cycle Reliability." IET Circuits, Devices & Systems (Wiley-Blackwell) 2026 (2026): 1. https://doi.org/10.1049/cds2/9915488.
MLA (9th ed.) CitationChandrasekaran, Sridhar, et al. "Memristor‐Based Logic Circuits: Gate Designs and Cycle‐To‐Cycle Reliability." IET Circuits, Devices & Systems (Wiley-Blackwell), vol. 2026, 2026, p. 1, https://doi.org/10.1049/cds2/9915488.