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Interferometric Surface Profile Measurement Based on Radial Polarization and Wavelength Variation.

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Bibliographic Details
Title:	Interferometric Surface Profile Measurement Based on Radial Polarization and Wavelength Variation.
Authors:	Chu, Yen-Chang¹, Bi, Wei-En², Chen, Jing-Heng¹, Chen, Kun-Huang², chenkh@fcu.edu.tw
Source:	Metrology; Jun2026, Vol. 6 Issue 2, p30, 10p
Database:	Applied Science & Technology Source

Description
ISSN:	26738244
DOI:	10.3390/metrology6020030