Investigation of Structural, Morphological, and Topographical Properties of InGaN/Porous Silicon Heterostructure Prepared by the PLD Technique.
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| Title: | Investigation of Structural, Morphological, and Topographical Properties of InGaN/Porous Silicon Heterostructure Prepared by the PLD Technique. |
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| Authors: | Saleh, Mohammed A.1,2, Fakhri, Makram A.3, makram.a.fakhri@uotechnology.edu.iqmokaram_76@yahoo.com, Ahmad, Ahmad K.1, Curreli, Nicola, nicola.curreli@unica.it |
| Source: | International Journal of Optics; 6/27/2026, Vol. 2026, p1-14, 14p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 16879384 |
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| DOI: | 10.1155/ijo/8079583 |
