View in EDS

车规级芯片可靠性测试加速老化模型研究.

Saved in:
Bibliographic Details
Title: 车规级芯片可靠性测试加速老化模型研究. (Chinese)
Authors: 尹研1, 周昕1, 张晶露1, 陈杰1, 陆晓磊2
Source: Automobile Technology; 2026, Issue 6, p38-44, 7p
Database: Applied Science & Technology Source
Description
ISSN:10003703
DOI:10.19620/j.cnki.1000-3703.20260112