| FullText | Text: Availability: 0 |
|---|---|
| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 195006988 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: 车规级芯片可靠性测试加速老化模型研究. (Chinese) – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22尹研%22">尹研</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22周昕%22">周昕</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22张晶露%22">张晶露</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22陈杰%22">陈杰</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22陆晓磊%22">陆晓磊</searchLink><relatesTo>2</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Automobile+Technology%22">Automobile Technology</searchLink>; 2026, Issue 6, p38-44, 7p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=195006988 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.19620/j.cnki.1000-3703.20260112 Languages: – Code: chi Text: Chinese PhysicalDescription: Pagination: PageCount: 7 StartPage: 38 Titles: – TitleFull: 车规级芯片可靠性测试加速老化模型研究. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: 尹研 – PersonEntity: Name: NameFull: 周昕 – PersonEntity: Name: NameFull: 张晶露 – PersonEntity: Name: NameFull: 陈杰 – PersonEntity: Name: NameFull: 陆晓磊 IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 06 Text: 2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 10003703 Numbering: – Type: issue Value: 6 Titles: – TitleFull: Automobile Technology Type: main |
| ResultId | 1 |