Time-domain THz characterization of semiconductors across a wide doping range by combined transmission spectroscopy and ellipsometry.
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| Title: | Time-domain THz characterization of semiconductors across a wide doping range by combined transmission spectroscopy and ellipsometry. |
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| Authors: | Mazaheri, Z.1, zahra.mazaheri@unina.it, Casalino, M.2, Crisci, T.3, Farooq, U.1, Iodice, M.2, Papari, G. P.1, Yaseen, J.1, Andreone, A.1 |
| Source: | Applied Physics Letters; 7/6/2026, Vol. 129 Issue 1, p1-7, 7p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036951 |
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| DOI: | 10.1063/5.0305395 |
