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Time-domain THz characterization of semiconductors across a wide doping range by combined transmission spectroscopy and ellipsometry.

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Title: Time-domain THz characterization of semiconductors across a wide doping range by combined transmission spectroscopy and ellipsometry.
Authors: Mazaheri, Z.1, zahra.mazaheri@unina.it, Casalino, M.2, Crisci, T.3, Farooq, U.1, Iodice, M.2, Papari, G. P.1, Yaseen, J.1, Andreone, A.1
Source: Applied Physics Letters; 7/6/2026, Vol. 129 Issue 1, p1-7, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 195271131
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Time-domain THz characterization of semiconductors across a wide doping range by combined transmission spectroscopy and ellipsometry.
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; 7/6/2026, Vol. 129 Issue 1, p1-7, 7p
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      – Type: doi
        Value: 10.1063/5.0305395
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      – Code: eng
        Text: English
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        PageCount: 7
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      – TitleFull: Time-domain THz characterization of semiconductors across a wide doping range by combined transmission spectroscopy and ellipsometry.
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              Text: 7/6/2026
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              Y: 2026
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            – TitleFull: Applied Physics Letters
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