In‐Situ Thermal Conductivity Modulation and Characterization of Silicon Carbide Nanowires via Bending Strain.
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| Title: | In‐Situ Thermal Conductivity Modulation and Characterization of Silicon Carbide Nanowires via Bending Strain. |
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| Authors: | Gu, Guangjie1, Fu, Yifan1, Li, Zhen2, Yan, Simin1, Jin, Zhanrui1, He, Shiqi1, Gao, Zijian1, Sun, Litao1, Nie, Meng1, m_nie@seu.edu.cn, Yin, Kuibo1, yinkuibo@seu.edu.cn |
| Source: | Advanced Materials Technologies; Jul2026, Vol. 11 Issue 13, p1-6, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 2365709X |
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| DOI: | 10.1002/admt.202501529 |
