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Ellipsometric Characterization of SiO2/Au/Cr Nanostructures for Stable SPR Sensors.

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Bibliographic Details
Title: Ellipsometric Characterization of SiO2/Au/Cr Nanostructures for Stable SPR Sensors.
Authors: Minailova, I.1, irinaminailova125@gmail.com, Ivakhno-Tsehelnyk, O.2, Shamrovska, P.2, Fedorenko, A.1, Kachur, N.1, Matyash, I.1, Maslov, V.1, Zhan, D. R. T.2
Source: Journal of Nano- & Electronic Physics; 2026, Vol. 18 Issue 3, p03011-1-03011-5, 5p
Database: Applied Science & Technology Source
Description
ISSN:20776772
DOI:10.21272/jnep.18(3).03011