APA (7th ed.) Citation

Minailova, I., Ivakhno-Tsehelnyk, O., Shamrovska, P., Fedorenko, A., Kachur, N., Matyash, I., . . . Zhan, D. R. T. (2026). Ellipsometric Characterization of SiO2/Au/Cr Nanostructures for Stable SPR Sensors. Journal of Nano- & Electronic Physics, 18(3), 03011-1. https://doi.org/10.21272/jnep.18(3).03011

Chicago Style (17th ed.) Citation

Minailova, I., O. Ivakhno-Tsehelnyk, P. Shamrovska, A. Fedorenko, N. Kachur, I. Matyash, V. Maslov, and D. R. T. Zhan. "Ellipsometric Characterization of SiO2/Au/Cr Nanostructures for Stable SPR Sensors." Journal of Nano- & Electronic Physics 18, no. 3 (2026): 03011-1. https://doi.org/10.21272/jnep.18(3).03011.

MLA (9th ed.) Citation

Minailova, I., et al. "Ellipsometric Characterization of SiO2/Au/Cr Nanostructures for Stable SPR Sensors." Journal of Nano- & Electronic Physics, vol. 18, no. 3, 2026, pp. 03011-1, https://doi.org/10.21272/jnep.18(3).03011.