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Ellipsometric Characterization of SiO2/Au/Cr Nanostructures for Stable SPR Sensors.

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Title: Ellipsometric Characterization of SiO2/Au/Cr Nanostructures for Stable SPR Sensors.
Authors: Minailova, I.1, irinaminailova125@gmail.com, Ivakhno-Tsehelnyk, O.2, Shamrovska, P.2, Fedorenko, A.1, Kachur, N.1, Matyash, I.1, Maslov, V.1, Zhan, D. R. T.2
Source: Journal of Nano- & Electronic Physics; 2026, Vol. 18 Issue 3, p03011-1-03011-5, 5p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 195320940
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Ellipsometric Characterization of SiO2/Au/Cr Nanostructures for Stable SPR Sensors.
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  Data: <searchLink fieldCode="AU" term="%22Minailova%2C+I%2E%22">Minailova, I.</searchLink><relatesTo>1</relatesTo>, <i>irinaminailova125@gmail.com</i><br /><searchLink fieldCode="AU" term="%22Ivakhno-Tsehelnyk%2C+O%2E%22">Ivakhno-Tsehelnyk, O.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Shamrovska%2C+P%2E%22">Shamrovska, P.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Fedorenko%2C+A%2E%22">Fedorenko, A.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kachur%2C+N%2E%22">Kachur, N.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Matyash%2C+I%2E%22">Matyash, I.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Maslov%2C+V%2E%22">Maslov, V.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhan%2C+D%2E+R%2E+T%2E%22">Zhan, D. R. T.</searchLink><relatesTo>2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Nano-+%26+Electronic+Physics%22">Journal of Nano- & Electronic Physics</searchLink>; 2026, Vol. 18 Issue 3, p03011-1-03011-5, 5p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=195320940
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        Value: 10.21272/jnep.18(3).03011
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      – Code: eng
        Text: English
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        PageCount: 5
        StartPage: 03011-1
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      – TitleFull: Ellipsometric Characterization of SiO2/Au/Cr Nanostructures for Stable SPR Sensors.
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              Text: 2026
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              Y: 2026
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