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Flexible Reliability Assessment of Electronic Components Under Complex Failure-Mode Scenarios.

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Bibliographic Details
Title: Flexible Reliability Assessment of Electronic Components Under Complex Failure-Mode Scenarios.
Authors: Méndez-González, Luis Carlos1, luis.mendez@uacj.mx, Rodríguez-Picón, Luis Alberto1,2, González-Hernández, Isidro Jesús2,3, Pérez-Olguín, Iván Juan Carlos1, García, Vicente2,3
Source: Applied Sciences (2076-3417); Jul2026, Vol. 16 Issue 13, p6588, 44p
Database: Applied Science & Technology Source
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ISSN:20763417
DOI:10.3390/app16136588