A Current and LFN Method for Individually Assessing Layer Quality in III–V Multi-Junctions.

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Bibliographic Details
Title:	A Current and LFN Method for Individually Assessing Layer Quality in III–V Multi-Junctions.
Authors:	Diaz, Alexandra¹, alexandra.diaz@grenoble-inp.fr, Jouanneau, Corentin^2,3, Bidaud, Thomas^2,3, Darnon, Maxime⁴, Hamon, Gwenaelle^2,3, Theodorou, Christoforos¹, Rafhay, Quentin¹
Source:	Fluctuation & Noise Letters; Oct2026, Vol. 25 Issue 5, p1-6, 6p
Database:	Applied Science & Technology Source

Description
ISSN:	02194775
DOI:	10.1142/S0219477525400115