APA (7th ed.) Citation

Diaz, A., Jouanneau, C., Bidaud, T., Darnon, M., Hamon, G., Theodorou, C., & Rafhay, Q. (2026). A Current and LFN Method for Individually Assessing Layer Quality in III–V Multi-Junctions. Fluctuation & Noise Letters, 25(5), 1. https://doi.org/10.1142/S0219477525400115

Chicago Style (17th ed.) Citation

Diaz, Alexandra, Corentin Jouanneau, Thomas Bidaud, Maxime Darnon, Gwenaelle Hamon, Christoforos Theodorou, and Quentin Rafhay. "A Current and LFN Method for Individually Assessing Layer Quality in III–V Multi-Junctions." Fluctuation & Noise Letters 25, no. 5 (2026): 1. https://doi.org/10.1142/S0219477525400115.

MLA (9th ed.) Citation

Diaz, Alexandra, et al. "A Current and LFN Method for Individually Assessing Layer Quality in III–V Multi-Junctions." Fluctuation & Noise Letters, vol. 25, no. 5, 2026, p. 1, https://doi.org/10.1142/S0219477525400115.