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A Current and LFN Method for Individually Assessing Layer Quality in III–V Multi-Junctions.

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Title: A Current and LFN Method for Individually Assessing Layer Quality in III–V Multi-Junctions.
Authors: Diaz, Alexandra1, alexandra.diaz@grenoble-inp.fr, Jouanneau, Corentin2,3, Bidaud, Thomas2,3, Darnon, Maxime4, Hamon, Gwenaelle2,3, Theodorou, Christoforos1, Rafhay, Quentin1
Source: Fluctuation & Noise Letters; Oct2026, Vol. 25 Issue 5, p1-6, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 197456346
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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      – Type: doi
        Value: 10.1142/S0219477525400115
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      – Code: eng
        Text: English
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      – TitleFull: A Current and LFN Method for Individually Assessing Layer Quality in III–V Multi-Junctions.
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            NameFull: Diaz, Alexandra
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            – D: 01
              M: 10
              Text: Oct2026
              Type: published
              Y: 2026
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            – TitleFull: Fluctuation & Noise Letters
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