A Current and LFN Method for Individually Assessing Layer Quality in III–V Multi-Junctions.
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| Title: | A Current and LFN Method for Individually Assessing Layer Quality in III–V Multi-Junctions. |
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| Authors: | Diaz, Alexandra1, alexandra.diaz@grenoble-inp.fr, Jouanneau, Corentin2,3, Bidaud, Thomas2,3, Darnon, Maxime4, Hamon, Gwenaelle2,3, Theodorou, Christoforos1, Rafhay, Quentin1 |
| Source: | Fluctuation & Noise Letters; Oct2026, Vol. 25 Issue 5, p1-6, 6p |
| Database: | Applied Science & Technology Source |
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